Travelled to:1 × Canada
Collaborated with:J.Y.Lee J.Lim
Talks about:trapdoor (1) analysi (1) detect (1) smart (1) power (1) time (1) card (1) use (1)
Person: Seok Won Jung
DBLP: Jung:Seok_Won
Contributed to:
2005Wrote 1 papers:
- TestCom-2005-LeeJL #analysis #detection #smarttech #using
- Detecting Trapdoors in Smart Cards Using Timing and Power Analysis (JYL, SWJ, JL), pp. 275–288.