Fehmi Jaafar, Yann-Gaël Guéhéneuc, Sylvie Hamel, Foutse Khomh
Mining the relationship between anti-patterns dependencies and fault-proneness
WCRE, 2013.
@inproceedings{WCRE-2013-JaafarGHK, author = "Fehmi Jaafar and Yann-Gaël Guéhéneuc and Sylvie Hamel and Foutse Khomh", booktitle = "{Proceedings of the 20th Working Conference on Reverse Engineering}", doi = "10.1109/WCRE.2013.6671310", editor = "Ralf Lämmel and Rocco Oliveto and Romain Robbes", pages = "351--360", publisher = "{IEEE}", title = "{Mining the relationship between anti-patterns dependencies and fault-proneness}", year = 2013, }