Travelled to:3 × USA
Collaborated with:J.Grason A.C.Parker S.Shteingart
Talks about:generat (2) design (2) test (2) microprogram (1) criterion (1) algorithm (1) testabl (1) multipl (1) hardwar (1) control (1)
Person: Andrew W. Nagle
DBLP: Nagle:Andrew_W=
Contributed to:
198519811980Wrote 3 papers:
- DAC-1985-ShteingartNG #automation #generative #named
- RTG: automatic register level test generator (SS, AWN, JG), pp. 803–807.
- DAC-1981-NagleP #algorithm #design #hardware #multi
- Algorithms for multiple-criterion design of microprogrammed control hardware (AWN, ACP), pp. 486–493.
- DAC-1980-GrasonN #design #generative #testing
- Digital test generation and design for testability (JG, AWN), pp. 175–189.