Travelled to:
1 × USA
Collaborated with:
K.Dembczynski W.Kotlowski W.Waegeman E.Hüllermeier
Talks about:
structur (1) approach (1) classif (1) versus (1) measur (1) optim (1) multi (1) minim (1) label (1) rule (1)
Person: Arkadiusz Jachnik
DBLP: Jachnik:Arkadiusz
Contributed to:
Wrote 1 papers:
- ICML-c3-2013-DembczynskiJKWH #approach #classification #multi #optimisation #plugin
- Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization (KD, AJ, WK, WW, EH), pp. 1130–1138.