Travelled to:1 × Finland
1 × Israel
1 × United Kingdom
2 × USA
Collaborated with:E.Hüllermeier W.Kotlowski W.Cheng R.Slowinski A.Jachnik W.Waegeman
Talks about:multilabel (3) classif (3) rank (3) loss (3) univari (2) optim (2) minim (2) label (2) rule (2) probabilist (1)
Person: Krzysztof Dembczynski
DBLP: Dembczynski:Krzysztof
Contributed to:
20132012201120102008Wrote 7 papers:
- ICML-c3-2013-DembczynskiJKWH #approach #classification #multi #optimisation #plugin
- Optimizing the F-Measure in Multi-Label Classification: Plug-in Rule Approach versus Structured Loss Minimization (KD, AJ, WK, WW, EH), pp. 1130–1138.
- ICML-2012-DembczynskiKH #consistency #multi #ranking
- Consistent Multilabel Ranking through Univariate Losses (KD, WK, EH), p. 175.
- ICML-2011-KotlowskiDH #ranking
- Bipartite Ranking through Minimization of Univariate Loss (WK, KD, EH), pp. 1113–1120.
- ICML-2010-ChengDH #ranking
- Label Ranking Methods based on the Plackett-Luce Model (WC, KD, EH), pp. 215–222.
- ICML-2010-ChengDH10a #classification #multi
- Graded Multilabel Classification: The Ordinal Case (WC, KD, EH), pp. 223–230.
- ICML-2010-DembczynskiCH #classification #multi #probability
- Bayes Optimal Multilabel Classification via Probabilistic Classifier Chains (KD, WC, EH), pp. 279–286.
- ICML-2008-DembczynskiKS
- Maximum likelihood rule ensembles (KD, WK, RS), pp. 224–231.