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Collaborated with:
Yuting Kong
Talks about:
metrolog (1) approach (1) predict (1) practic (1) circuit (1) system (1) integr (1) defect (1) yield (1) inlin (1)

Person: Dong Ni

DBLP DBLP: Ni:Dong

Contributed to:

CASE 20172017

Wrote 1 papers:

CASE-2017-KongN #approach #fault #predict #using
A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits (YK, DN), pp. 744–749.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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