Travelled to:1 × Korea
Collaborated with:B.Yum S.Kim
Talks about:semiconductor (1) bibliograph (1) manufactur (1) pattern (1) analysi (1) review (1) defect (1) wafer (1)
Person: Jae Hoon Koo
DBLP: Koo:Jae_Hoon
Contributed to:
2012Wrote 1 papers:
- CASE-2012-YumKK #analysis #bibliography #perspective
- Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review (BJY, JHK, SJK), pp. 86–90.