Travelled to:
1 × Korea
Collaborated with:
B.Yum J.H.Koo
Talks about:
semiconductor (1) bibliograph (1) manufactur (1) pattern (1) analysi (1) review (1) defect (1) wafer (1)
Person: Seong-Jun Kim
DBLP: Kim:Seong=Jun
Contributed to:
Wrote 1 papers:
- CASE-2012-YumKK #analysis #bibliography #perspective
- Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review (BJY, JHK, SJK), pp. 86–90.