Travelled to:2 × USA
Collaborated with:R.V.Meter S.Y.H.Su
Talks about:microprocessor (1) standard (1) approach (1) output (1) detect (1) compon (1) stuck (1) input (1) fault (1) digit (1)
Person: Mark G. Karpovsky
DBLP: Karpovsky:Mark_G=
Contributed to:
19841980Wrote 2 papers:
- DAC-1984-KarpovskyM #approach #testing
- An approach to the testing of microprocessors (MGK, RVM), pp. 196–202.
- DAC-1980-KarpovskyS #component #detection #fault #standard
- Detecting bridging and stuck-at faults at input and output pins of standard digital components (MGK, SYHS), pp. 494–505.