Travelled to:1 × Spain
Collaborated with:L.R.V.d.Doel L.J.v.Vliet K.T.Hjelt I.T.Young F.Gromball J.G.Korvink
Talks about:micromachin (1) interfer (1) picolit (1) nanomet (1) analysi (1) measur (1) height (1) scale (1) fring (1) vial (1)
Person: Michael J. Vellekoop
DBLP: Vellekoop:Michael_J=
Contributed to:
2000Wrote 1 papers:
- ICPR-v3-2000-DoelVHVYGK #analysis #metric
- Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis (LRVdD, LJvV, KTH, MJV, ITY, FG, JGK), pp. 3057–3062.