Travelled to:2 × USA
Collaborated with:R.A.Rasmussen H.C.Godoy G.B.Franklin M.E.Schwass F.J.Villante R.E.France N.H.Garges E.J.Orosz
Talks about:test (3) generat (2) automat (2) system (2) logic (2) complianc (1) structur (1) diagnosi (1) approach (1) testabl (1)
Person: Peter S. Bottorff
DBLP: Bottorff:Peter_S=
Contributed to:
19771970Wrote 4 papers:
- DAC-1977-BottorffFGO #generative #logic #network #scalability #testing
- Test generation for large logic networks (PSB, REF, NHG, EJO), pp. 479–485.
- DAC-1977-GodoyFB #automation #design #logic #testing
- Automatic checking of logic design structures For compliance with testability ground rules (HCG, GBF, PSB), pp. 469–478.
- DAC-1970-BottorffR #generative #testing
- A view of a user-oriented production test data generation system (PSB, RAR), pp. 90–94.
- DAC-1970-BottorffSV #approach #automation #fault #memory management #problem #testing
- An automatic system approach to the problem of memory circuit testing & fault diagnosis (PSB, MES, FJV), pp. 95–99.