Travelled to:3 × USA
Collaborated with:M.T.McMahon B.C.Rosales ∅
Talks about:test (3) generat (2) structur (1) electron (1) project (1) automat (1) analysi (1) system (1) podem (1) place (1)
Person: Prabhakar Goel
DBLP: Goel:Prabhakar
Contributed to:
198219811980Wrote 3 papers:
- DAC-1982-GoelM
- Electronic Chip-in-Place Test (PG, MTM), pp. 482–488.
- DAC-1981-GoelR #automation #generative #logic #named #testing
- PODEM-X: An automatic test generation system for VLSI logic structures (PG, BCR), pp. 260–268.
- DAC-1980-Goel #analysis #generative #testing
- Test generation costs analysis and projections (PG), pp. 77–84.