Travelled to:
1 × USA
Collaborated with:
C.A.Harlow S.E.Henderson D.A.Rayfield R.J.Johnston
Talks about:
electron (1) inspect (1) assembl (1) autom (1)
Person: Samuel J. Dwyer III
DBLP: III:Samuel_J=_Dwyer
Contributed to:
Wrote 1 papers:
- DAC-1974-HarlowHRJD #automation
- Automated inspection of electronic assemblies (CAH, SEH, DAR, RJJ, SJDI), pp. 98–106.