Travelled to:1 × USA
Collaborated with:D.M.Schuler E.G.Ulrich T.E.Baker
Talks about:generat (1) concurr (1) random (1) simul (1) logic (1) test (1) use (1)
Person: Susan P. Bryant
DBLP: Bryant:Susan_P=
Contributed to:
1975Wrote 1 papers:
- DAC-1975-SchulerUBB #concurrent #generative #logic #random testing #simulation #testing #using
- Random test generation using concurrent logic simulation (DMS, EGU, TEB, SPB), pp. 261–267.