Travelled to:1 × Austria
Collaborated with:M.Yoshizawa H.Washizaki Y.Fukazawa N.Yoshioka T.Okubo H.Kaiya
Talks about:pattern (1) verifi (1) design (1) applic (1) tesem (1) secur (1) model (1) tool (1) test (1)
Person: Takanori Kobashi
DBLP: Kobashi:Takanori
Contributed to:
Wrote 1 papers:
- ICST-2015-KobashiYWFYOK #design pattern #named #security #testing #verification
- TESEM: A Tool for Verifying Security Design Pattern Applications by Model Testing (TK, MY, HW, YF, NY, TO, HK), pp. 1–8.












