Travelled to:
1 × Germany
Collaborated with:
M.Hashizume M.Ichimiya H.Yotsuyanagi
Talks about:
current (1) suppli (1) detect (1) defect (1) test (1) open (1) cmos (1)
Person: Takeomi Tamesada
DBLP: Tamesada:Takeomi
Contributed to:
Wrote 1 papers:
- DATE-2001-HashizumeIYT #detection #fault
- CMOS open defect detection by supply current test (MH, MI, HY, TT), p. 509.