Travelled to:
1 × India
Collaborated with:
F.Su S.Chang C.Fan J.Jheng C.Kao C.Lu
Talks about:
semiconductor (1) manufactur (1) knowledg (1) approach (1) symptom (1) ontolog (1) identif (1) yield (1) novel (1) engin (1)
Person: Ya-Jung Tsai
DBLP: Tsai:Ya=Jung
Contributed to:
Wrote 1 papers:
- CASE-2009-SuCFTJKL #approach #identification #information management #novel #ontology
- A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing (FHS, SCC, CMF, YJT, JJ, CPK, CYL), pp. 433–438.