Collaborated with:C.Chien Bo-Cheng Wang J.Wu Yi-Chia Wu Peng-Chieh Lee Runliang Dou Chia-Cheng Chen
Talks about:semiconductor (2) manufactur (2) multivari (1) collinear (1) parametr (1) classif (1) enhanc (1) detect (1) analyt (1) yield (1)
Person: Ying-Jen Chen
DBLP: Chen:Ying=Jen
Contributed to:
2017Wrote 2 papers:
- CASE-2017-ChenWWWC #big data #classification #detection #fault #multi
- Big data analytic for multivariate fault detection and classification in semiconductor manufacturing (YJC, BCW, JZW, YCW, CFC), pp. 731–736.
- CASE-2017-ChienLDCC #modelling #parametricity
- Modeling collinear WATs for parametric yield enhancement in semiconductor manufacturing (CFC, PCL, RD, YJC, CCC), pp. 739–743.