Collaborated with:
J.Y.0001 A.Zhikhartsev L.T.0001
Talks about:
better (2) program (1) repair (1) autom (1) test (1) case (1)
Person: Yuefei Liu
DBLP: Liu:Yuefei
Contributed to:
Wrote 1 papers:
- ESEC-FSE-2017-YangZLT #automation #program repair #testing
- Better test cases for better automated program repair (JY0, AZ, YL, LT0), pp. 831–841.