Maik Anderka, Benno Stein, Nedim Lipka
Detection of text quality flaws as a one-class classification problem
CIKM, 2011.
@inproceedings{CIKM-2011-AnderkaSL,
author = "Maik Anderka and Benno Stein and Nedim Lipka",
booktitle = "{Proceedings of the 20th ACM International Conference on Information and Knowledge Management}",
doi = "10.1145/2063576.2063954",
isbn = "978-1-4503-0717-8",
pages = "2313--2316",
publisher = "{ACM}",
title = "{Detection of text quality flaws as a one-class classification problem}",
year = 2011,
}











