Maik Anderka, Benno Stein, Nedim Lipka
Detection of text quality flaws as a one-class classification problem
CIKM, 2011.
@inproceedings{CIKM-2011-AnderkaSL, author = "Maik Anderka and Benno Stein and Nedim Lipka", booktitle = "{Proceedings of the 20th ACM International Conference on Information and Knowledge Management}", doi = "10.1145/2063576.2063954", isbn = "978-1-4503-0717-8", pages = "2313--2316", publisher = "{ACM}", title = "{Detection of text quality flaws as a one-class classification problem}", year = 2011, }