Computer aided test pattern generation for digital processors
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Klaus Pfeuffer
Computer aided test pattern generation for digital processors
DAC, 1977.

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@inproceedings{DAC-1977-Pfeuffer,
	acmid         = "809107",
	author        = "Klaus Pfeuffer",
	booktitle     = "{Proceedings of the 14th Design Automation Conference}",
	pages         = "68--77",
	publisher     = "{ACM}",
	title         = "{Computer aided test pattern generation for digital processors}",
	year          = 1977,
}

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