Andrzej Krasniewski, Slawomir Pilarski
Circular Self-Test Path: A Low-Cost BIST Technique
DAC, 1987.
@inproceedings{DAC-1987-KrasniewskiP,
author = "Andrzej Krasniewski and Slawomir Pilarski",
booktitle = "{Proceedings of the 24th Design Automation Conference}",
doi = "10.1145/37888.37949",
pages = "407--415",
publisher = "{IEEE Computer Society Press / ACM}",
title = "{Circular Self-Test Path: A Low-Cost BIST Technique}",
year = 1987,
}











