@inproceedings{DAC-1989-ChoB,
	author        = "K. Cho and Randal E. Bryant",
	booktitle     = "{Proceedings of the 26th Design Automation Conference}",
	doi           = "10.1145/74382.74452",
	pages         = "418--423",
	publisher     = "{ACM Press}",
	title         = "{Test Pattern Generation for Sequential MOS Circuits by Symbolic Fault Simulation}",
	year          = 1989,
}