John Giraldi, Michael L. Bushnell
EST: The New Frontier in Automatic Test-Pattern Generation
DAC, 1990.
@inproceedings{DAC-1990-GiraldiB, author = "John Giraldi and Michael L. Bushnell", booktitle = "{Proceedings of the 27th Design Automation Conference}", doi = "10.1145/123186.123434", isbn = "0-89791-363-9", pages = "667--672", publisher = "{IEEE Computer Society Press}", title = "{EST: The New Frontier in Automatic Test-Pattern Generation}", year = 1990, }