Travelled to:1 × France
5 × USA
Collaborated with:V.D.Agrawal T.J.Chakraborty D.R.Brasen J.Giraldi X.Chen S.W.Director K.Heragu S.T.Chakradhar S.Parikh J.Sienicki G.Ramakrishnan
Talks about:generat (3) automat (3) fault (3) delay (3) test (3) sequenti (2) circuit (2) design (2) ulyss (2) estim (2)
Person: Michael L. Bushnell
DBLP: Bushnell:Michael_L=
Contributed to:
1994
199419931992199019881986Wrote 9 papers:
- DAC-1994-HeraguBA #fault #performance
- An Efficient Path Delay Fault Coverage Estimator (KH, MLB, VDA), pp. 516–521.
- EDAC-1994-ParikhSBSG #automation #design #distributed #fault #framework
- Distributed Computing, Automatic Design, and Error Recovery in the ULYSSES II Framework (SP, MLB, JS, GR), pp. 610–617.
- DAC-1993-ChakrabortyAB #design #fault #testing
- Design for Testability for Path Delay faults in Sequential Circuits (TJC, VDA, MLB), pp. 453–457.
- DAC-1992-ChakrabortyAB #fault #generative #logic #modelling #random #testing
- Delay Fault Models and Test Generation for Random Logic Sequential Circuits (TJC, VDA, MLB), pp. 165–172.
- DAC-1990-BrasenB #algorithm #named #optimisation
- MHERTZ: A New Optimization Algorithm for Floorplanning and Global Routing (DRB, MLB), pp. 107–110.
- DAC-1990-ChakradharAB #automation #generative #polynomial #programming #testing #using
- Automatic Test Generation Using Quadratic 0-1 Programming (STC, VDA, MLB), pp. 654–659.
- DAC-1990-GiraldiB #automation #future of #generative #named
- EST: The New Frontier in Automatic Test-Pattern Generation (JG, MLB), pp. 667–672.
- DAC-1988-ChenB #layout
- A Module Area Estimator for VLSI Layout (XC, MLB), pp. 54–59.
- DAC-1986-BushnellD #integration #tool support #using
- VLSI CAD tool integration using the Ulysses environment (MLB, SWD), pp. 55–61.