Eun Sei Park, M. Ray Mercer
An Efficient Delay Test Generation System for Combinational Logic Circuits
DAC, 1990.
@inproceedings{DAC-1990-ParkM,
author = "Eun Sei Park and M. Ray Mercer",
booktitle = "{Proceedings of the 27th Design Automation Conference}",
doi = "10.1145/123186.123390",
isbn = "0-89791-363-9",
pages = "522--528",
publisher = "{IEEE Computer Society Press}",
title = "{An Efficient Delay Test Generation System for Combinational Logic Circuits}",
year = 1990,
}