Person: M. Ray Mercer

DBLP: Mercer:M=_Ray

Contributed to:

2004

2002

2002

1994

1992

1991

1990

1989

1988

1987

1985

Wrote 16 papers:

DATE-v2-2004-DworakCWM #detection #fault

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects (JD, BC, JW, MRM), pp. 1066–1071.

DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using

Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.

DATE-2002-KapurWM #logic

Directed-Binary Search in Logic BIST Diagnostics (RK, TWW, MRM), p. 1121.

DATE-2002-LeeCDGM #algorithm #detection #fault #multi #testing

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults (SL, BC, JD, MRG, MRM), pp. 94–99.

EDAC-1994-BrashearMOPM #analysis #performance #predict #statistics #using

Predicting Circuit Performance Using Circuit-level Statistical Timing Analysis (RBB, NM, CO, LTP, MRM), pp. 332–337.

DAC-1992-MercerKR #functional #generative #order #performance

Functional Approaches to Generating Orderings for Efficient Symbolic Representations (MRM, RK, DER), pp. 624–627.

DAC-1991-ButlerRKM #diagrams #heuristic #order #performance

Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams (KMB, DER, RK, MRM), pp. 417–420.

DAC-1991-WilliamsUM #network #testing

The Interdependence Between Delay-Optimization of Synthesized Networks and Testing (TWW, BU, MRM), pp. 87–92.

DAC-1990-ButlerM #design #fault #performance

The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design (KMB, MRM), pp. 673–678.

DAC-1990-ParkM #generative #logic #performance #testing

An Efficient Delay Test Generation System for Combinational Logic Circuits (ESP, MRM), pp. 522–528.

DAC-1989-GloverM #approach #fault #testing

A Deterministic Approach to Adjacency Testing for Delay Faults (CTG, MRM), pp. 351–356.

DAC-1988-GaedeRMB #automation #concurrent #named #parallel #testing #using

CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology (RKG, DER, MRM, KMB), pp. 597–600.

DAC-1988-GloverM #fault #generative #testing

A Method of Delay Fault Test Generation (CTG, MRM), pp. 90–95.

DAC-1987-KirklandM #algorithm

A Topological Search Algorithm for ATPG (TEK, MRM), pp. 502–508.

DAC-1987-SmithMB #simulation

Demand Driven Simulation: BACKSIM (SPS, MRM, BB), pp. 181–187.

DAC-1985-SchellM #algorithm #development #named

CADTOOLS: a CAD algorithm development system (ES, MRM), pp. 658–666.