Michael J. Batek, John P. Hayes
Test-Set Preserving Logic Transformations
DAC, 1992.
@inproceedings{DAC-1992-BatekH, acmid = "113938.149565", author = "Michael J. Batek and John P. Hayes", booktitle = "{Proceedings of the 29th Design Automation Conference}", isbn = "0-8186-2822-7", pages = "454--458", publisher = "{IEEE Computer Society Press}", title = "{Test-Set Preserving Logic Transformations}", year = 1992, }