Reliability challenges for 45nm and beyond
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J. W. McPherson
Reliability challenges for 45nm and beyond
DAC, 2006.

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@inproceedings{DAC-2006-McPherson,
	author        = "J. W. McPherson",
	booktitle     = "{Proceedings of the 43rd Design Automation Conference}",
	doi           = "10.1145/1146909.1146959",
	isbn          = "1-59593-381-6",
	pages         = "176--181",
	publisher     = "{ACM}",
	title         = "{Reliability challenges for 45nm and beyond}",
	year          = 2006,
}

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