J. W. McPherson
Reliability challenges for 45nm and beyond
DAC, 2006.
@inproceedings{DAC-2006-McPherson, author = "J. W. McPherson", booktitle = "{Proceedings of the 43rd Design Automation Conference}", doi = "10.1145/1146909.1146959", isbn = "1-59593-381-6", pages = "176--181", publisher = "{ACM}", title = "{Reliability challenges for 45nm and beyond}", year = 2006, }