Jiangyi Li, Mingoo Seok
Robust and In-Situ Self-Testing Technique for Monitoring Device Aging Effects in Pipeline Circuits
DAC, 2014.
@inproceedings{DAC-2014-LiS,
author = "Jiangyi Li and Mingoo Seok",
booktitle = "{Proceedings of the 51st Annual Design Automation Conference}",
doi = "10.1145/2593069.2593205",
isbn = "978-1-4503-2730-5",
pages = "6",
publisher = "{ACM}",
title = "{Robust and In-Situ Self-Testing Technique for Monitoring Device Aging Effects in Pipeline Circuits}",
year = 2014,
}