Makoto Sugihara, Hiroto Yasuura, Hiroshi Date
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
DATE, 2000.
@inproceedings{DATE-2000-SugiharaYD,
author = "Makoto Sugihara and Hiroto Yasuura and Hiroshi Date",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840029",
isbn = "0-7695-0537-6",
pages = "134--140",
publisher = "{IEEE Computer Society}",
title = "{Analysis and Minimization of Test Time in a Combined BIST and External Test Approach}",
year = 2000,
}