Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
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Makoto Sugihara, Hiroto Yasuura, Hiroshi Date
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach
DATE, 2000.

DATE 2000
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@inproceedings{DATE-2000-SugiharaYD,
	author        = "Makoto Sugihara and Hiroto Yasuura and Hiroshi Date",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840029",
	isbn          = "0-7695-0537-6",
	pages         = "134--140",
	publisher     = "{IEEE Computer Society}",
	title         = "{Analysis and Minimization of Test Time in a Combined BIST and External Test Approach}",
	year          = 2000,
}

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