Smriti Joshi, Anne Lombardot, Marc Belleville, Edith Beigné, Stéphane Girard
A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits
DATE, 2013.
@inproceedings{DATE-2013-JoshiLBBG,
acmid = "2485543",
author = "Smriti Joshi and Anne Lombardot and Marc Belleville and Edith Beigné and Stéphane Girard",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "1056--1057",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits}",
year = 2013,
}