A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits
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Smriti Joshi, Anne Lombardot, Marc Belleville, Edith Beigné, Stéphane Girard
A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits
DATE, 2013.

DATE 2013
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@inproceedings{DATE-2013-JoshiLBBG,
	acmid         = "2485543",
	author        = "Smriti Joshi and Anne Lombardot and Marc Belleville and Edith Beigné and Stéphane Girard",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1056--1057",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{A gate level methodology for efficient statistical leakage estimation in complex 32nm circuits}",
	year          = 2013,
}

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