Sampling-based buffer insertion for post-silicon yield improvement under process variability
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Grace Li Zhang, Bing Li 0005, Ulf Schlichtmann
Sampling-based buffer insertion for post-silicon yield improvement under process variability
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-ZhangLS,
	author        = "Grace Li Zhang and Bing Li 0005 and Ulf Schlichtmann",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459539/",
	isbn          = "978-3-9815-3707-9",
	pages         = "1457--1460",
	publisher     = "{IEEE}",
	title         = "{Sampling-based buffer insertion for post-silicon yield improvement under process variability}",
	year          = 2016,
}


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