Grace Li Zhang, Bing Li 0005, Ulf Schlichtmann
Sampling-based buffer insertion for post-silicon yield improvement under process variability
DATE, 2016.
@inproceedings{DATE-2016-ZhangLS,
author = "Grace Li Zhang and Bing Li 0005 and Ulf Schlichtmann",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459539/",
isbn = "978-3-9815-3707-9",
pages = "1457--1460",
publisher = "{IEEE}",
title = "{Sampling-based buffer insertion for post-silicon yield improvement under process variability}",
year = 2016,
}