Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs
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Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas
Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs
DATE, 2017.

DATE 2017
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@inproceedings{DATE-2017-BhowmikDB,
	author        = "Biswajit Bhowmik and Jatindra Kumar Deka and Santosh Biswas",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7926985",
	isbn          = "978-3-9815370-8-6",
	pages         = "214--219",
	publisher     = "{IEEE}",
	title         = "{Charka: A reliability-aware test scheme for diagnosis of channel shorts beyond mesh NoCs}",
	year          = 2017,
}


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