António Canelas, Ricardo Martins 0003, Ricardo Povoa, Nuno Lourenço 0003, Nuno Horta
Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing
DATE, 2017.
@inproceedings{DATE-2017-CanelasMP0H,
author = "António Canelas and Ricardo Martins 0003 and Ricardo Povoa and Nuno Lourenço 0003 and Nuno Horta",
booktitle = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2017.7927171",
isbn = "978-3-9815370-8-6",
pages = "1201--1206",
publisher = "{IEEE}",
title = "{Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing}",
year = 2017,
}