Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing
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António Canelas, Ricardo Martins 0003, Ricardo Povoa, Nuno Lourenço 0003, Nuno Horta
Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing
DATE, 2017.

DATE 2017
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@inproceedings{DATE-2017-CanelasMP0H,
	author        = "António Canelas and Ricardo Martins 0003 and Ricardo Povoa and Nuno Lourenço 0003 and Nuno Horta",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927171",
	isbn          = "978-3-9815370-8-6",
	pages         = "1201--1206",
	publisher     = "{IEEE}",
	title         = "{Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing}",
	year          = 2017,
}


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