@inproceedings{DATE-2017-LeeY,
	author        = "Seung-Yeob Lee and Joon-Sung Yang",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927105",
	isbn          = "978-3-9815370-8-6",
	pages         = "846--851",
	publisher     = "{IEEE}",
	title         = "{MVP ECC : Manufacturing process variation aware unequal protection ECC for memory reliability}",
	year          = 2017,
}