FPGA-based failure mode testing and analysis for MLC NAND flash memory
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Meng Zhang 0014, Fei Wu 0005, He Huang, Qian Xia, Jian Zhou 0004, Changsheng Xie
FPGA-based failure mode testing and analysis for MLC NAND flash memory
DATE, 2017.

DATE 2017
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@inproceedings{DATE-2017-ZhangWHXZX,
	author        = "Meng Zhang 0014 and Fei Wu 0005 and He Huang and Qian Xia and Jian Zhou 0004 and Changsheng Xie",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927029",
	isbn          = "978-3-9815370-8-6",
	pages         = "434--439",
	publisher     = "{IEEE}",
	title         = "{FPGA-based failure mode testing and analysis for MLC NAND flash memory}",
	year          = 2017,
}


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