Meng Zhang 0014, Fei Wu 0005, He Huang, Qian Xia, Jian Zhou 0004, Changsheng Xie
FPGA-based failure mode testing and analysis for MLC NAND flash memory
DATE, 2017.
@inproceedings{DATE-2017-ZhangWHXZX,
author = "Meng Zhang 0014 and Fei Wu 0005 and He Huang and Qian Xia and Jian Zhou 0004 and Changsheng Xie",
booktitle = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2017.7927029",
isbn = "978-3-9815370-8-6",
pages = "434--439",
publisher = "{IEEE}",
title = "{FPGA-based failure mode testing and analysis for MLC NAND flash memory}",
year = 2017,
}