@inproceedings{DATE-2018-WangKKK,
	author        = "Longfei Wang and S. Karen Khatamifard and Ulya R. Karpuzcu and Selçuk Köse",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342116",
	isbn          = "978-3-9819263-0-9",
	pages         = "803--808",
	publisher     = "{IEEE}",
	title         = "{Mitigation of NBTI induced performance degradation in on-chip digital LDOs}",
	year          = 2018,
}