On Functional Test Generation for Deep Neural Network IPs
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Bo Luo, Yu Li, Lingxiao Wei, Qiang Xu 0001
On Functional Test Generation for Deep Neural Network IPs
DATE, 2019.

DATE 2019
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@inproceedings{DATE-2019-LuoLW0,
	author        = "Bo Luo and Yu Li and Lingxiao Wei and Qiang Xu 0001",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8715042",
	isbn          = "978-3-9819263-2-3",
	pages         = "1010--1015",
	publisher     = "{IEEE}",
	title         = "{On Functional Test Generation for Deep Neural Network IPs}",
	year          = 2019,
}


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