Kaveh Shamsi, Meng Li 0004, David Z. Pan, Yier Jin
KC2: Key-Condition Crunching for Fast Sequential Circuit Deobfuscation
DATE, 2019.
@inproceedings{DATE-2019-Shamsi0PJ,
author = "Kaveh Shamsi and Meng Li 0004 and David Z. Pan and Yier Jin",
booktitle = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2019.8715053",
isbn = "978-3-9819263-2-3",
pages = "534--539",
publisher = "{IEEE}",
title = "{KC2: Key-Condition Crunching for Fast Sequential Circuit Deobfuscation}",
year = 2019,
}