Feng Qin, Shan Lu, Yuanyuan Zhou
SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs
HPCA, 2005.
@inproceedings{HPCA-2005-QinLZ, author = "Feng Qin and Shan Lu and Yuanyuan Zhou", booktitle = "{Proceedings of the 11th International Conference on High-Performance Computer Architecture}", doi = "10.1109/HPCA.2005.29", isbn = "0-7695-2275-0", pages = "291--302", publisher = "{IEEE Computer Society}", title = "{SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs}", year = 2005, }