David Hattery, Murray H. Loew
Depth from physics: physics-based image analysis and feature definition
ICPR, 1998.
@inproceedings{ICPR-1998-HatteryL, author = "David Hattery and Murray H. Loew", booktitle = "{Proceedings of the 14th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.1998.711243", isbn = "0-8186-8512-3", pages = "711--713", publisher = "{IEEE Computer Society}", title = "{Depth from physics: physics-based image analysis and feature definition}", year = 1998, }