@inproceedings{ICPR-v3-2000-DoelVHVYGK,
	author        = "L. R. Van den Doel and Lucas J. van Vliet and K. T. Hjelt and Michael J. Vellekoop and Ian T. Young and F. Gromball and Jan G. Korvink",
	booktitle     = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 3}",
	doi           = "10.1109/ICPR.2000.903485",
	isbn          = "0-7695-0750-6",
	pages         = "3057--3062",
	publisher     = "{IEEE Computer Society}",
	title         = "{Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis}",
	year          = 2000,
}