Predicting the benefit of sample size extension in multiclass k-NN classification
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Christian Kier, Til Aach
Predicting the benefit of sample size extension in multiclass k-NN classification
ICPR, 2006.

ICPR v3 2006
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@inproceedings{ICPR-v3-2006-KierA,
	author        = "Christian Kier and Til Aach",
	booktitle     = "{Proceedings of the 18th International Conference on Pattern Recognition, Volume 3}",
	doi           = "10.1109/ICPR.2006.942",
	isbn          = "0-7695-2521-0",
	pages         = "332--335",
	publisher     = "{IEEE Computer Society}",
	title         = "{Predicting the benefit of sample size extension in multiclass k-NN classification}",
	year          = 2006,
}

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