Oleg Okun, Matti Pietikäinen
Automatic Ground-Truth Generation for Skew-Tolerance Evaluation of Document Layout Analysis Methods
ICPR, 2000.
@inproceedings{ICPR-v4-2000-OkunP, author = "Oleg Okun and Matti Pietikäinen", booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 4}", doi = "10.1109/ICPR.2000.902937", isbn = "0-7695-0750-6", pages = "4376--4379", publisher = "{IEEE Computer Society}", title = "{Automatic Ground-Truth Generation for Skew-Tolerance Evaluation of Document Layout Analysis Methods}", year = 2000, }