A test-suite diagnosability metric for spectrum-based fault localization approaches
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Alexandre Perez, Rui Abreu, Arie van Deursen
A test-suite diagnosability metric for spectrum-based fault localization approaches
ICSE, 2017.

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@inproceedings{ICSE-2017-PerezAD,
	author        = "Alexandre Perez and Rui Abreu and Arie van Deursen",
	booktitle     = "{Proceedings of the 39th International Conference on Software Engineering}",
	doi           = "10.1109/ICSE.2017.66",
	ee            = "https://www.wikidata.org/entity/Q57908619",
	isbn          = "978-1-5386-3868-2",
	pages         = "654--664",
	publisher     = "{IEEE / ACM}",
	title         = "{A test-suite diagnosability metric for spectrum-based fault localization approaches}",
	year          = 2017,
}

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