Tingting Yu, Myra B. Cohen
Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems
ICST, 2015.
@inproceedings{ICST-2015-YuC, author = "Tingting Yu and Myra B. Cohen", booktitle = "{Proceedings of the Eighth IEEE International Conference on Software Testing, Verification and Validation}", doi = "10.1109/ICST.2015.7102592", isbn = "978-1-4799-7125-1", pages = "1--10", publisher = "{IEEE}", title = "{Guided Test Generation for Finding Worst-Case Stack Usage in Embedded Systems}", year = 2015, }