An Empirical Study on the Use of Defect Prediction for Test Case Prioritization
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David Paterson, José Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn
An Empirical Study on the Use of Defect Prediction for Test Case Prioritization
ICST, 2019.

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@inproceedings{ICST-2019-PatersonCAKFM,
	author        = "David Paterson and José Campos and Rui Abreu and Gregory M. Kapfhammer and Gordon Fraser and Phil McMinn",
	booktitle     = "{Proceedings of the 12th International Conference on Software Testing, Verification and Validation}",
	doi           = "10.1109/ICST.2019.00041",
	isbn          = "978-1-7281-1736-2",
	pages         = "346--357",
	publisher     = "{IEEE}",
	title         = "{An Empirical Study on the Use of Defect Prediction for Test Case Prioritization}",
	year          = 2019,
}

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