David Paterson, José Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn
An Empirical Study on the Use of Defect Prediction for Test Case Prioritization
ICST, 2019.
@inproceedings{ICST-2019-PatersonCAKFM,
author = "David Paterson and José Campos and Rui Abreu and Gregory M. Kapfhammer and Gordon Fraser and Phil McMinn",
booktitle = "{Proceedings of the 12th International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2019.00041",
isbn = "978-1-7281-1736-2",
pages = "346--357",
publisher = "{IEEE}",
title = "{An Empirical Study on the Use of Defect Prediction for Test Case Prioritization}",
year = 2019,
}
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