Charitha Saumya, Jinkyu Koo, Milind Kulkarni 0001, Saurabh Bagchi
XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions
ICST, 2019.
@inproceedings{ICST-2019-SaumyaK0B,
author = "Charitha Saumya and Jinkyu Koo and Milind Kulkarni 0001 and Saurabh Bagchi",
booktitle = "{Proceedings of the 12th International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2019.00011",
isbn = "978-1-7281-1736-2",
pages = "1--12",
publisher = "{IEEE}",
title = "{XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions}",
year = 2019,
}
Tags: