Using Test Plans for Bayesian Modeling
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Rainer Deventer, Joachim Denzler, Heinrich Niemann, Oliver Kreis
Using Test Plans for Bayesian Modeling
MLDM, 2003.

MLDM 2003
Full names Links ISxN
	author        = "Rainer Deventer and Joachim Denzler and Heinrich Niemann and Oliver Kreis",
	booktitle     = "{Proceedings of the Third International Conference on Machine Learning and Data Mining in Pattern Recognition}",
	doi           = "10.1007/3-540-45065-3_27",
	isbn          = "3-540-40504-6",
	pages         = "307--316",
	publisher     = "{Springer International Publishing}",
	series        = "{Lecture Notes in Computer Science}",
	title         = "{Using Test Plans for Bayesian Modeling}",
	volume        = 2734,
	year          = 2003,


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