Rainer Deventer, Joachim Denzler, Heinrich Niemann, Oliver Kreis
Using Test Plans for Bayesian Modeling
MLDM, 2003.
@inproceedings{MLDM-2003-DeventerDNK,
author = "Rainer Deventer and Joachim Denzler and Heinrich Niemann and Oliver Kreis",
booktitle = "{Proceedings of the Third International Conference on Machine Learning and Data Mining in Pattern Recognition}",
doi = "10.1007/3-540-45065-3_27",
isbn = "3-540-40504-6",
pages = "307--316",
publisher = "{Springer International Publishing}",
series = "{Lecture Notes in Computer Science}",
title = "{Using Test Plans for Bayesian Modeling}",
volume = 2734,
year = 2003,
}
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